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Rapid determination of the photometric bidirectional scatter distribution function by use of a near field goniophotometer

Leloup, F.B., De Ketelaere, W., Audenaert, J. and Hanselaer, P.
Keywords:

bidirectional reflectance distribution function, near-field goniophotometry, optical metrology, material appearance characterization

Document typeProceeding
Journal title / SourcePROCEEDINGS OF SPIE VOLUME 9018: Measuring, Modeling, and Reproducing Material Appearance
Peer-reviewed articleYes
Volume9018
IssueNA
Page numbers / Article number8 pages / Article no. 901803
Publisher's nameSPIE
Publisher's address (city only)Bellingham
Publication date 2014-02-24
Conference nameMeasuring, Modeling, and Reproducing Material Appearance
Conference date2 February 2014
Conference placeSan Francisco
ISSNNA
DOI10.1117/12.2035958
ISBNNA
Web URLhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1835519
LanguageEnglish

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