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"Multidimensional reflectometry for industry" (xD-Reflect) an European research project

Höpe, A. (Physikalisch-Technische Bundesanstalt), Koo, A. (Measurement Standards Lab), Verdu, F.-M. (Univ. de Alicante), Leloup, F.-B. (Katholieke Univ. Leuven), Obein, G. (Conservatoire national des arts et métiers), Wübbeler, G. (Physikalisch-Technische Bundesanstalt), Campos, J. (Consejo Superior de Investigaciones Cientificas), Iacomussi, P. (Instituto Nazionale die Ricerca Metrologia), Jaanson, P. (Mittatekniikan Keskus), Källberg, S. (SP Sveriges Tekniska Forskningsinstitut AB) and Smids, M. (Cesky Metrologicky Institut Brno)
Keywords:

Reflectometry ; Metrology ; Modeling ; Optical design ; Optical testing ; Bidirectional reflectance transmission function ; CCD cameras ; Calibration ; Data analysis ; Light sources

Document typeProceeding
Journal title / SourceProceedings of SPIE
Peer-reviewed articleYes
Volume9018
Page numbers / Article number901804
Publisher's nameSPIE - The International Society for Optical Engineering
Publisher's address (city only)Bellingham
Publication date 2014-02-24
Conference nameMeasuring, Modeling, and Reproducing Material Appearance
Conference date4-5 February, 2014
Conference placeSan Francisco (USA)
ISSN0277-786X
DOI10.1117/12.2035981
ISBN978-0-8194-9935-6
Web URLhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1835520
LanguageEnglish

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