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Low-loss photon-to-electron conversion

Manoocheri, F. (Metrology Research Institute, Aalto University, Espoo, Finland Centre for Metrology and Accreditation (MIKES), Espoo, Finland), Sildoja, M. (Metrology Research Institute, Aalto University, Espoo, Finland Centre for Metrology and Accreditation (MIKES), Espoo, Finland), Dönsberg, T. (Metrology Research Institute, Aalto University, Espoo, Finland Centre for Metrology and Accreditation (MIKES), Espoo, Finland), Merimaa, M. (Centre for Metrology and Accreditation (MIKES), Espoo, Finland) and Ikonen, E. (Metrology Research Institute, Aalto University, Espoo, Finland, Centre for Metrology and Accreditation (MIKES), Espoo, Finland)
Keywords:

silicon photodiode, quantum efficiency, optical power measurement, PQED

Document typeArticle
Journal title / SourceOptical Review
Peer-reviewed articleYes
Volume21
Issue3
Page numbers / Article number320-324
Publisher's nameSpringer
Publisher's address (city only)Cham
Publication date 2014-06-6
ISSN1340-6000
DOI10.1007/s10043-014-0048-3
Web URLhttp://link.springer.com/journal/10043
LanguageEnglish

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