Verification of an optical micro-CMM using the focus variation technique: Aspects of probing errors
Sun, W (NPL, Teddington, United Kingdom), Claverley, J. D. (NPL, Teddington, United Kingdom) and Claverley, JamesMetrology, Optical, Coordinate measuring machine (CMM)
| Document type | Article |
| Journal title / Source | CIRP Annals Manufacturing Technology |
| Peer-reviewed article | Yes |
| Volume | 64 |
| Issue | 2 |
| Page numbers / Article number | 511-514 |
| Publisher's name | ELSEVIER |
| Publisher's address (city only) | Amsterdam |
| Publication date | 2015-08-1 |
| ISSN | 0007-8506 |
| DOI | 10.1016/j.cirp.2015.04.089 |
| Web URL | http://www.sciencedirect.com/science/article/pii/S0007850615000979 |
| Language | English |