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Temperature drift compensation in Fourier-transform integrated micro-spectrometers

Velasco, A. V. (CSIC), Galindo-Santos, J. (CSIC), Cheben, P. (NRC), Calvo, M. L (UCM), Schmid, J. (NRC), Delage, A. (NRC), Xu, D.-X. (NRC), Janz, S. (NRC) and Corredera, P. (CSIC)
Keywords:

integrated optics, spectroscopy, Fourier transform, Silicon on insulator, temperature drift, spectral retrieval.

Document typeArticle
Journal title / SourceOptica Pura y Aplicada
Peer-reviewed articleYes
Volume48
Issue4
Page numbers / Article number283-289
Publisher's nameSEDOPTICA
Publisher's address (city only)MADRID
Publication date 2015-12-1
ISSN-
DOI10.7149/OPA.48.4.283
Web URL-
LanguageSpanish

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