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SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry

Pollinger, F. (PTB, Braunschweig, Germany), Mildner, J. (PTB, Braunschweig, Germany), Köchert, P. (PTB, Braunschweig, Germany), Yang, R. (PTB, Braunschweig, Germany), Bosnjakovic, A. (IMBIH, Sarajevo, Bosnia and Herzegovina), Meyer, T. (PTB, Braunschweig, Germany), Wedde, M. (PTB, Braunschweig, Germany) and Meiners-Hagen, K. (PTB, Brauschweig, Germany)
Keywords:

EDM, multi-wavelength interferometry, index of refraction, EMRP JRP SIB60 Surveying

Document typeProceeding
Journal title / SourceProceedings of the third Joint International Symposium on Deformation Monitoring
Page numbers / Article numberSubmission 15
Publication date 2016-04
Conference nameJoint International Symposium on Deformation Monitoring
Conference date30-03-2016 to 01-04-2016
Conference placeVienna, Austria
Web URLhttp://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf
LanguageEnglish
Persistent Identifierhttp://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf

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