SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry
Pollinger, F. (PTB, Braunschweig, Germany), Mildner, J. (PTB, Braunschweig, Germany), Köchert, P. (PTB, Braunschweig, Germany), Yang, R. (PTB, Braunschweig, Germany), Bosnjakovic, A. (IMBIH, Sarajevo, Bosnia and Herzegovina), Meyer, T. (PTB, Braunschweig, Germany), Wedde, M. (PTB, Braunschweig, Germany) and Meiners-Hagen, K. (PTB, Brauschweig, Germany)EDM, multi-wavelength interferometry, index of refraction, EMRP JRP SIB60 Surveying
| Document type | Proceeding |
| Journal title / Source | Proceedings of the third Joint International Symposium on Deformation Monitoring |
| Page numbers / Article number | Submission 15 |
| Publication date | 2016-04 |
| Conference name | Joint International Symposium on Deformation Monitoring |
| Conference date | 30-03-2016 to 01-04-2016 |
| Conference place | Vienna, Austria |
| Web URL | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |
| Language | English |
| Persistent Identifier | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |