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Traceable quantitative Raman spectrometry and x-ray fluorescence analysis as non-destructive methods for spatially resolved chemical characterization of Cu(In,Ga)Se2 absorber films

Zakel, SZ (Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany), Pollakowski, BP (Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany), Streeck, CS (Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany), Wundrack, SW (Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany), Weber, AW (Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109 Berlin, Germany), Brunken, SB (Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109 Berlin, Germany), Mainz, RM (Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109 Berlin, Germany), Beckhoff, BB (Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany) and Stosch, RS (Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany)
Keywords:

Calibration, Cu(In; Ga)Se2, International System of Units, Measurement uncertainty, Raman mapping, Raman spectrometry, SI, Solar cell, Traceability, X-ray spectrometry

Document typeArticle
Journal title / SourceApplied Spectroscopy
Peer-reviewed articleYes
Volume70
Issue2
Page numbers / Article number279-288
Publisher's nameSAGE Publications 
Publication date 2016-02
ISSN0003-7028
DOI10.1177/0003702815620131.
Web URLhttp://www.ncbi.nlm.nih.gov/pubmed/26903563
LanguageEnglish

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