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Nanoscale optical spectroscopy: an emerging tool for the characterization of graphene and related 2-D materials

Pollard, A.J. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK), Kumar, N. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK), Rae, A. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK), Mignuzzi, S. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK), Su, W. (2Institute of Material Physics, Hangzhou Dianzi University, 310018, Hangzhou, China 3Ningbo Institute of Materials Technology &Engineering, Chinese Academy of Sciences, 315201, Ningbo, China.) and Roy, D. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK)
Keywords:

Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS), photoluminescence, defects, contamination, 2-D materials

Document typeArticle
Journal title / Sourcejournal of Materials NanoScience
Peer-reviewed articleYes
Volume1
Issue1
Page numbers / Article number39-49
Publisher's nameIntergrated Science
Publisher's address (city only)New Delhi
Publication date 2014-02-1
ISSN2394-0867
Web URLhttp://www.pubs.iscience.in/journal/index.php/jmns/article/view/195
LanguageEnglish

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