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Development of a System for Measuring the Shape of β Spectra Using a Semiconductor Si Detector

BISCH, CB (CEA), MOUGEOT, XM (CEA), BE, MB (CEA) and NOURREDDINE, AN (IPHC)
Keywords:

Beta spectra, semi-conductor detector

Document typeArticle
Journal title / SourceNuclear Data Sheets
Peer-reviewed articleYes
Volume120
Issue-
Page numbers / Article number95-98
Publisher's nameELSEVIER
Publisher's address (city only)Amsterdam
Publication date 2014
ISSN0090-3752
DOI10.1016/j.nds.2014.07.016
Web URL-
LanguageEnglish
Persistent Identifierhttp://www.sciencedirect.com/science/article/pii/S0090375214004682

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