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Automated Extraction and Assessment of Functional Features of Areal Measured Microstructures Using a Segmentation-Based Evaluation Method

Hartmann, WH (Institute of Manufacturing Metrology, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Nägelsbachstraße 25, 91052 Erlangen, Germany) and Loderer, AL (Institute of Manufacturing Metrology, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Nägelsbachstraße 25, 91052 Erlangen, Germany)
Keywords:

Keywords, surface metrology, microstructure, segmentation techniques, function-oriented

Document typeArticle
Journal title / SourceSurface Topography: Metrology and Properties STMP
Peer-reviewed articleYes
Volume2
Issue4
Page numbers / Article number044001
Publisher's nameIOP Publishing
Publication date 2014-10-20
ISSN2051-672X
DOI10.1088/2051-672X/2/4/044001
Web URLhttp://iopscience.iop.org/article/10.1088/2051-672X/2/4/044001?fromSearchPage=true
LanguageEnglish

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