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The Effect of Bilayer Regions on the Response of Epitaxial Graphene Devices to Environmental Gating

Hill-Pearce, R. E. (NPL, Teddington, UK), Eless, V (NPL, Teddington, UK), Lartsev, A (Chalmers University of Technology, Göteborg, Sweden), Martin, N. A. (NPL, Teddington, UK), Barker-Snook, I. L. (NPL, Teddington, UK), Helmore, J. J. (NPL, Teddington, UK), Yakimova, R. (Linköping University, Linköping, Sweden), Gallop, J. C. (NPL, Teddington, UK) and Hao, L (NPL, Teddington, UK)
Keywords:

grapheme, metrology, scanning Kelvin probe microscopy

Document typeArticle
Journal title / SourceCarbon
Peer-reviewed articleYes
Volume93
Issuen/a
Page numbers / Article number896–902
Publisher's nameElsevier
Publisher's address (city only)Amsterdam
Publication date 2015-05-23
ISSNn/a
DOI10.1016/j.carbon.2015.05.061
Web URLhttp://www.sciencedirect.com/science/article/pii/S0008622315004686
LanguageEnglish

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