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Full characterization of optical Transition-Edge Sensor by impedance spectroscopy measurements in a bandwidth extending to 1 MHz

Lolli, L (INRIM, Turin, Italy), Taralli, E (INRIM, Turin, Italy), Monticone, E (INRIM, Turin, Italy), Rajteri, M (INRIM, Turin, Italy), Callegaro, L (INRIM, Turin, Italy), Numata, T (AIST, Tsukuba, Japan) and Fukuda, D (AIST, Tsukuba, Japan)
Keywords:

transition edge sensors, quantum metrology, single photon detectors

Document typeProceeding
Journal title / SourceIEEE
Peer-reviewed articleYes
Volumen/a
Issuen/a
Page numbers / Article number1-4
Publisher's nameIEEE
Publisher's address (city only)New York
Publication date 2013-07-7
Conference nameIEEE 14th International Superconductive Electronics Conference
Conference date07-07-2013 to 11-07-2013
Conference placeCambridge, Masachussetts
ISSNn/a
DOI10.1109/ISEC.2013.6604291
ISBN978-1-4673-6369-3
Web URLhttp://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6604291&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6604291
LanguageEnglish

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