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Convenient Graphene-Based Quantum Hall Resistance Standards

Brun-Pcard, J. (LNE, France), Ribeiro-Palau, R. (LNE, France), Lafont, F. (LNE, France), Kazazis, D. (CNRS, France), Michon, A. (CNRS, France), Cheynis, F. (CINaM, CNRS/Aix-Marseille Université, France), Couturaud, O. (CNRS, France), Consejo, C. (CNRS, France), Jouault, B. (CNRS, France), Poirier, W. (LNE, France) and Schopfer, F. (LNE, France)
Keywords:

Graphene, materials science and technology, measurement standards, metrology, quantum Hall effect devices

Document typeProceeding
Journal title / SourceDigest on Conference on Precision Electromagnetic Measurements (CPEM2016)
Peer-reviewed articleYes
Publisher's nameIEEE
Publication date 2016-08-11
Conference nameCPEM 2016
Conference date10-07-2016 to 15-07-2016
Conference placeOttawa, Canada
ISSN2160-0171
DOI10.1109/CPEM.2016.7540650
ISBN978-1-4673-9134-4
Web URLhttp://ieeexplore.ieee.org/document/7540650/
LanguageEnglish

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