Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy
Martinek, JM (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic), Valtr, MV (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic), Cimrman, RC (New Technologies Research Centre, University of West Bohemia, Univerzitní 2732/8, 306 14 Plzeň, Czech Republic) and Klapetek, PK (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic)scanning thermal microscopy, thin films, thermal conductivity
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Peer-reviewed article | Yes |
| Volume | 25 |
| Issue | 4 |
| Page numbers / Article number | 044022 |
| Publisher's name | IOP Publishing |
| Publication date | 2014-03 |
| ISSN | 0957-0233 |
| DOI | 10.1088/0957-0233/25/4/044022 |
| Web URL | https://www.researchgate.net/publication/260559141_Thermal_conductivity_analysis_of_delaminated_thin_films_by_scanning_thermal_microscopy |
| Language | English |