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Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy

Martinek, JM (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic), Valtr, MV (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic), Cimrman, RC (New Technologies Research Centre, University of West Bohemia, Univerzitní 2732/8, 306 14 Plzeň, Czech Republic) and Klapetek, PK (Český metrologický institut, Romana Havelky 294/17, 586 01 Jihlava, Czech Republic)
Keywords:

scanning thermal microscopy, thin films, thermal conductivity

Document typeArticle
Journal title / SourceMeasurement Science and Technology
Peer-reviewed articleYes
Volume25
Issue4
Page numbers / Article number044022
Publisher's nameIOP Publishing
Publication date 2014-03
ISSN0957-0233
DOI10.1088/0957-0233/25/4/044022
Web URLhttps://www.researchgate.net/publication/260559141_Thermal_conductivity_analysis_of_delaminated_thin_films_by_scanning_thermal_microscopy
LanguageEnglish

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