Welcome to the EURAMET Repository Link

The EURAMET Repository Link is an online service providing links to scientific papers published within the European Metrology Research Programme (EMRP), the European Metrology Programme for Innovation and Research (EMPIR) and projects funded by iMERA-Plus.

References
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All :: Yacoot, Yager, Yaghooby, Yakimova, ... , Yver Kwok
Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy
Klapetek, P., Yacoot, A., Hortvík, V., Duchoň, V., Dongmo, H., Rerucha, S. (ISI, Brno, CZ), Valtr, M. and Nečas, D.
2020

Measurement Science and Technology (2020)

Type: 
Article
Project title: 
15SIB09: 3DNano: Traceable three-dimensional nanometrology
Name of Call / Funding Programme: 
EMPIR 2015: SI Broader Scope
Bringing real-time traceability to high-speed atomic force microscopy
Heaps, E., Yacoot, A., Dongmo, H., Picco, L., Payton, O.D. (University of Bristol, Bristol, UK), Russell-Pavier, F.S and Klapetek, P (Czech Metrology Institute (CMI), Brno , Okruzni 31, 638 00, Czech Republic)
2020

Measurement Science and Technology (2020)

Type: 
Article
Project title: 
15SIB09: 3DNano: Traceable three-dimensional nanometrology
Name of Call / Funding Programme: 
EMPIR 2015: SI Broader Scope
Design and performance of a test rig for evaluation of nanopositioning stages
Yacoot, Andrew (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW), Klapetek, Petr (Cesky Metrologicky Institut Brno, Okružní 31, CZ-638 00 Brno), Valtr, Miroslav, Grolich, Petr, Dongmo, Herve, Lazzerini, Giovanni M and Bridges, Angus
2019

Measurement Science and Technology 30 (2019) , 035002

Type: 
Article
Project title: 
15SIB09: 3DNano: Traceable three-dimensional nanometrology
Name of Call / Funding Programme: 
EMPIR 2015: SI Broader Scope
Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
Yacoot, Andrew (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW), Rerucha, Simon, Pham, Tuan M, Cizek, Martin, Hucl, Vaclav, Číp, Ondřej and Lazar, Josef
2017

Measurement Science and Technology 28 (2017) , 045204

Type: 
Article
Project title: 
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme: 
EMRP A169: Call 2012 Metrology for Industry (II)
Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester
Lazzerini, G.M. (NPL, Teddington, UK), Paternò, G.M. (University College, London, UK), Tregnago, G. (Univeristy College, London, UK), Treat, N. (Imperial College, London, UK), Stingelin, N. (Imperial College, London, UK), Yacoot, A. (NPL, Teddington, UK) and Cacialli, F. (University College, London, UK)
2016

Appliced Physics Letters 108 (2016) , 053303

Type: 
Article
Project title: 
NEW05: MechProNO: Traceable measurement of mechanical properties of nano-objects
Name of Call / Funding Programme: 
EMRP A169: Call 2011 Metrology for New Technologies
Key criteria for the determination of geometrical properties of nano-objects under different adhesion levels
Lazzerini, M. (NPL, Teddington, UK) and Yacoot, A. (NPL, Teddington, UK)
2015

(2015)

Type: 
Technical report
Project title: 
NEW05: MechProNO: Traceable measurement of mechanical properties of nano-objects
Name of Call / Funding Programme: 
EMRP A169: Call 2011 Metrology for New Technologies
Large area high-speed metrology SPM system
Klapetek, P, Valtr, M, Picco, L, Payton, O D, Martinek, J, Yacoot, A and Miles, M
2015

Nanotechnology 26 (2015)

Type: 
Article
Project title: 
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme: 
EMRP A169: Call 2012 Metrology for Industry (II)
Performance verification of a dual sensor stage
Yacoot, A. (NPL, Teddington, UK), Mountford, J. (NPL, Teddington, UK), Tedaldi, M. (NPL, Teddington, UK), Reid, B. (Queensgate Instruments, Torquay, UK) and Levy, S. (Queensgate Instruments, Torquay, UK)
2014

Proceedings of the 14th euspen International Conference – Dubrovnik – June 2014 I (2014) , P4.38, 309V1

Type: 
Proceeding
Project title: 
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme: 
EMRP A169: Call 2012 Metrology for Industry (II)
Joint Research on Scatterometry and AFM Wafer Metrology
Bodermann, B., Buhr, E., Danzebrink, H.-U., Bär, M., Scholze, F., Krumrey, M., Wurm, M., Klapetek, P., Hansen, P.-E., Korpelainen, V., van Veghel, M., Yacoot, A., Siitonen, S., El Gawhary, O., Burger, S. and Saastamoinen, T.
2011

AIP Conference Proceedings 1395 (2011)

Type: 
Proceeding
Project title: 
IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: 
EMRP A169: Call 2010 Industry
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