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Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast
Dong Hyun, Kim (Department of Physics, Chungnam National University, Daejeon, Korea), Sung-Jo, Kim (Department of Physics, Chungnam National University, Daejeon, Korea), Jeong-Seon, Yu (Department of Physics, Chungnam National University, Daejeon, Korea) and Jong-Hyun, Kim (Department of Physics, Chungnam National University, Daejeon, Korea)
2015

Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast 19 (2015) , 503-507

Type: 
Article
Project title: 
SIB51: GraphOhm: Quantum resistance metrology based on graphene
Name of Call / Funding Programme: 
EMRP A169: Call 2012 SI Broader scope (II)
1 RESULT(S)
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