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Čeliković, I., Pantelić, G., Vukanac, I., Nikolić, J.K., Živanović, M., Cinelli, G., Gruber, V., Baumann, S., Quindos Poncela, L.S. and Rabago, D.

Čeliković, I., Pantelić, G., Vukanac, I., Nikolić, J.K., Živanović, M., Cinelli, G., Gruber, V., Baumann, S., Quindos Poncela, L.S. and Rabago, D.

Zelenka, Z., Alisic, S., Hanrahan, R., Kolozinsky, I., Popa, G., Zůda, J. and Malengo, A.

Forssén, C., Silander, I., Zakrisson, J., Zelan, M. (Department of Measurement Technologies, SP Technical Research Institute of Sweden, Borås, Sweden) and Axner, O.

Sud, A., Tacchi, S., Sagkovits, D., Barton, C., Sall, M., Diez, L.H., Stylianidis, E., Smith, N., Wright, L. (NPL), Zhang, S., Zhang, X., Ravelosona, D., Carlotti, G., Kurebayashi, H., Kazakova, O. and Cubukcu, M.

Graham, E., Thiemann, K., Kartmann, S., Batista, E. (IPQ), Bissig, H. (METAS), Niemann, A., Boudaoud, A.W., Ogheard, F. (CETIAT), Zhang, Y. and Zagnoni, M.

Röttger, A., Veres, A., Sochor, V., Pinto, M., Derlacinski, M., Ioan, M-R., Sabeta, A., Bernat, R., Adam-Guillermin, C., Gracia Alves, J.H., Glavič-Cindro, D. (Jožef Stefan Institute, Ljubljana. Slovenia), Bell, S., Wens, B., Persson, L., Živanović, M. and Nylund, R.

Hui, S.C.N., Mikkelsen, M., Zöllner, H.J., Ahluwalia, V., Alcauter, S., Baltusis, L., Barany, D.A., Barlow, L.R., Becker, R., Berman, J.I., Berrington, A., Bhattacharyya, P.K., Blicher, J.U., Bogner, W., Brown, M.S., Calhoun, V.D., Castillo, R., Cecil, K.M., Choi, Y.B., Chu, W.C.W., Clarke, W.T., Craven, A.R., Cuypers, K., Dacko, M., de la Fuente-Sandoval, C., Desmond, P., Domagalik, A., Dumont, J., Duncan, N.W., Dydak, U., Dyke, K., Edmondson, D.A., Ende, G., Ersland, L., Evans, C.J., Fermin, A.S.R., Ferretti, A., Fillmer, A., Gong, T., Greenhouse, I., Grist, J.T., Gu, M., Harris, A.D., Hat, K., Heba, S., Heckova, E., Hegarty, J.P., Heise, K-F., Honda, S., Jacobson, A., Jansen, J.F.A., Jenkins, C.W., Johnston, S.J., Juchem, C., Kangarlu, A., Kerr, A.B., Landheer, K., Lange, T., Lee, P., Levendovszky, S.R., Limperopoulos, C., Liu, F., Lloyd, W., Lythgoe, D.J., Machizawa, M.G., MacMillan, E.L., Maddock, R.J., Manzhurtsev, A.V., Martinez-Gudino, M.L., Miller, J.J., Mirzakhanian, H., Moreno-Ortega, M., Mullins, P.G., Nakajima, S., Near, J., Noeske, R., Nordhøy, W., Oeltzschner, G., Osorio-Duran, R., Otaduy, M.C.G., Pasaye, E.H., Peeters, R., Peltier, S.J., Pilatus, U., Polomac, N., Porges, E.C., Pradhan, S., Prisciandaro, J.J., Puts, N.A., Rae, C.D., Reyes-Madrigal, F., Roberts, T.P.L., Robertson, C.E., Rosenberg, J.T., Rotaru, D-G., O'Gorman Tuura, R.L., Saleh, M.G., Sandberg, K., Sangill, R., Schembri, K., Schrantee, A., Semenova, N.A., Singel, D., Sitnikov, R., Smith, J., Song, Y., Stark, C., Stoffers, D., Swinnen, S.P., Tain, R., Tanase, C., Tapper, S., Tegenthoff, M., Thiel, T., Thioux, M., Truong, P., van Dijk, P., Vella, N., Vidyasagar, R., Vovk, A., Wang, G., Westlye, L.T., Wilbur, T.K., Willoughby, W.R., Wilson, M., Wittsack, H-J., Woods, A.J., Wu, Y-C., Xu, J., Lopez, M.Y., Yeung, D.K.W., Zhao, Q., Zhou, X., Zupan, G. and Edden, R.A.E.

Vidaković-Koch, T., Miličić, T., Živković, L.A., Chan, H.S., Krewer, U. and Petkovska, M.

Weidinger, P., Dubowik, A., Lehrmann, C., Yogal, N., Kumme, R., Zweiffel, M., Eich, N., Mester, C. and Zhang, H.

Song, Z., Weidinger, P., Eich, N., Zhang, H., Yogal, N. and Kumme, R.

Forssén, C., Silander, I., Zakrisson, J., Axner, O. and Zelan, M. (Department of Measurement Technologies, SP Technical Research Institute of Sweden, Borås, Sweden)