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Solar cells manufacturers will benefit from the new techniques developed in EMRP project for fast mapping of complex thin films.
The complexity of thin films means that there are technical challenges relating to their performance, durability and cost-effective manufacturing. EMRP research has validated a new experimental method, and corresponding software, for fast photocurrent mapping measurements of homogeneity of solar cell which is crucial to performance and reliability.
EMRP project Traceable characterisation of thin-film materials for energy applications (ENG53 ThinErgy) is developing the measurements needed to characterise the structure of thin films and their novel properties. The method developed is significantly faster than currently possible, reducing measurement time from hours to minutes, and could be used as quality control during manufacturing of photovoltaics.
22-25 June 2020, Nuremberg Exhibition Centre, Germany – Call for papers ends 31 January 2020! more
The evaluation process of the Stage 2 Call for 2019 has been finalised more
LNE to host a workshop in Paris, France on 21 - 22 January 2020 more
The EURAMET family grew in May this year when Moldova gained full membership more