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Solar cells manufacturers will benefit from the new techniques developed in EMRP project for fast mapping of complex thin films.
The complexity of thin films means that there are technical challenges relating to their performance, durability and cost-effective manufacturing. EMRP research has validated a new experimental method, and corresponding software, for fast photocurrent mapping measurements of homogeneity of solar cell which is crucial to performance and reliability.
EMRP project Traceable characterisation of thin-film materials for energy applications (ENG53 ThinErgy) is developing the measurements needed to characterise the structure of thin films and their novel properties. The method developed is significantly faster than currently possible, reducing measurement time from hours to minutes, and could be used as quality control during manufacturing of photovoltaics.
Novel black silicon photodiodes developed in EMRP project has led to success for start-up company more
New ISO standard for magnetic nanoparticles now available more
Through the work of EMPIR projects scientists have developed the world’s fastest metrological Atomic Force Microscope more
Combustion pyrometer successfully measures sub-millisecond temperature transients more