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Solar cells manufacturers will benefit from the new techniques developed in EMRP project for fast mapping of complex thin films.
The complexity of thin films means that there are technical challenges relating to their performance, durability and cost-effective manufacturing. EMRP research has validated a new experimental method, and corresponding software, for fast photocurrent mapping measurements of homogeneity of solar cell which is crucial to performance and reliability.
EMRP project Traceable characterisation of thin-film materials for energy applications (ENG53 ThinErgy) is developing the measurements needed to characterise the structure of thin films and their novel properties. The method developed is significantly faster than currently possible, reducing measurement time from hours to minutes, and could be used as quality control during manufacturing of photovoltaics.
Geodetic Observing system implements new procedure more
One month before the end of the three-year EMPIR project RFMicrowave, a highly successful workshop on project outputs was held at TÜBİTAK UME in Turke... more
Project helps accelerate quality infrastructure that supports digital transformation more
Updated calibration guide will improve the harmonisation of volumetric measurement calibrations more
Paper about new single-photon source is published in Advanced Quantum Technologies more