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Solar cells manufacturers will benefit from the new techniques developed in EMRP project for fast mapping of complex thin films.
The complexity of thin films means that there are technical challenges relating to their performance, durability and cost-effective manufacturing. EMRP research has validated a new experimental method, and corresponding software, for fast photocurrent mapping measurements of homogeneity of solar cell which is crucial to performance and reliability.
EMRP project Traceable characterisation of thin-film materials for energy applications (ENG53 ThinErgy) is developing the measurements needed to characterise the structure of thin films and their novel properties. The method developed is significantly faster than currently possible, reducing measurement time from hours to minutes, and could be used as quality control during manufacturing of photovoltaics.
EURAMET and partners held a successful series of events on ‘digital transformation challenges’ in September more
Calibrator based on technology developed in this project has been sold to a major European calibration service provider more
7 – 9 September 2021, Lyon France and also online more
Publication from EMPIR nanometrology project wins award in the field of precision measurement more
Applications invited for award enabling two metrological institutions to work together more