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CORM 2008 Conference
CORM 2008 conference June 9-12, 2008 at Rensselaer Polytechnic Institute (RPI), http://www.corm.org/
NANOSCALE 2008
2008-09-22
Seminars on quantitative microscopy and nanoscale calibration standards and methods... more
CIE Symposium on road surface photometric characteristics: measurement systems and results
2008-07-09
INRIM ,Turin, Italy more