- About EURAMET
- Research & Innovation
- Metrology for Society's Challenges
- World Metrology Day 2023
- Case Studies
- EURAMET's contribution to the COVID-19 response
- SI redefinition
- World Metrology Day 2021
- Metrology for Energy
- Metrology for Health
- Metrology for Environment
- Metrology for Industry
- Measurements for New Technologies
- Future measurement standards
- Metrology and Standardisation
- EMRP Achievements
- Impact
- Technical Committees
- European Metrology Networks
- Knowledge Transfer
- Publications & Media Centre
- Search Contacts
- Publications Repository Link
Please type a search term (at least two characters)
News
New facility for nanoscale electronic devices in the RF frequency
VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices
Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.
EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.
Project event discussing research for new international standards on smart grids drew worldwide attendance more
Friday 27 September 2019 14:00 – 15:00 CEST more
9 – 13 September 2019, Aachen, Germany more
Collaboration between two EMPIR projects enables demonstration of new temperature measurement technique for PV devices more
EMPIR project makes open access data sets available more