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News
New facility for nanoscale electronic devices in the RF frequency
VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices
Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.
EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.
The videos regarding the metrology of appearance cover a variety of topics and will help increase photometry and radiometry expertise across National ... more
Graphene could revolutionise many technology sectors but needs standardisation more
Take part in EURAMET workshop and BIPM survey! more
CEN, CENELEC, EA, EURAMET, and WELMEC join forces to reinforce and promote the European Quality Infrastructure more
The sampler will allow for safer, more efficient and representative sampling to ensure biomass is suitable to be used as fuel more