News

New facility for nanoscale electronic devices in the RF frequency

Photograph of measurement setup – Courtesy of VSL

VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices

Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.

EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.

Select your area of interest
New and revised EURAMET Calibration Guidelines
2018-01-23

Guidelines aimed at improving harmonisation for measurement instrument calibrations. more

EMPIR Call 2018: Stage 1 OPEN
2018-01-10

EURAMET announces the launch of the 2018 call for the following topic areas within the European Metrology Programme for Innovation and Research (EMPIR... more

EMPIR CALL 2017: FINALISATION OF EVALUATION PROCESS
2018-01-09

The evaluation process of the Stage 2 Call for 2017 has been finalised more

Page 1 of 104.