Please type a search term (at least two characters)
News
New facility for nanoscale electronic devices in the RF frequency
VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices
Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.
EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.
The new tool will improve quality control for nanomaterials used in renewable energy generation more
EMPIR project continues dissemination activities, including the revision of the IEC 60060-1 and IEC 60060-2 standards more
Carbon dioxide, released from man-made activities, is lowering the pH of the Earth’s oceans, and impacting the health of marine organisms worldwide more
Supporting automated and reconfigurable manufacturing systems more
Working with external project Cool White to test and suggest improvements on the locally available white paints more