Please type a search term (at least two characters)
VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices
Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.
EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.
Happy World Meteorological Day more
MMC-2016, organised as part of EMRP project, facilitated communication and co-operation between metrology and meteorology communities more
Anniversary Flashback on capacity building and knowledge transfer more
Work on the measurement of naturally occurring radionuclides carried out in EMRP project recognised at the ICRM LLRMT 2016 conference more