NPL researcher gives invited talks in Europe and China
High-frequency microchips are in widespread use and are a key enabling technology in systems that employ micro- and nano-electronics, such as mobile communications and radar sensors in driverless cars. On-wafer high-frequency measurements have already had an impact on chip fabrication costs and their industrial assurance and traceability will be established in EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal).
Researcher, Chong Li, from project partner NPL has given a series of invited talks on the current challenges and future development of microwave and millimetrewave on-wafer measurement in and outside of Europe. Chong presented at an EMPIR-funded seminar at the Delft University of Technology, Netherlands, and gave talks at the Chinese Academy of Space Technology (CAST) in Xi’an, China, the Beijing Institute of Radio Metrology and Measurement (BIRM) and the National Institute of Metrology (NIM), both in Beijing, China.
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