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News
New facility for nanoscale electronic devices in the RF frequency
VNA measurement system enables high-frequency measurements for nanoscale planar electronic devices
Vector network analysers (VNAs) are the most precise measurement instruments at high frequencies and work is needed to extend their measurement capability to the nanoscale. EMPIR project Microwave measurements for planar circuits and components (14IND02 PlanarCal) is working towards using VNAs to perform traceable on-wafer high-frequency measurements for nanoscale planar electronic devices.
EMPIR partners TU Delft and VSL have designed an active microwave interferometer for use with existing VNA measurement systems. Embedding such an interferometer in a VNA system allows a high measurement resolution to be replicated. Experiments have demonstrated the feasibility of such a method, and this extended capability would play a crucial role in development of new technologies and devices.
The project partners publicised the metrological developments for electronic brachytherapy and were able to contribute to several standards more
EMPIR project established clinical procedures that allow use of traceable methodologies for molecular radiotherapy across Europe more
A small collaborative project aimed at extending knowledge in the field of eye tonometers has increased its impact more
Improving large-scale dimensional measurements for manufacturing more
From 2012 to 2016 the IEEE published standards for high-frequency waveguides. EMPIR NeWITT project supports their uptake more