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Verification concepts in S-parameter measurements

Mubarak, F. (VSL, Van Swinden Laboratorium, Delft, The Netherlands), Zeier, M. (Federal Institute of Metrology METAS, Lindenweg 50, 3003 Bern-Wabern, Switzerland), Hoffmann, J. (Federal Institute of Metrology METAS, Lindenweg 50, 3003 Bern-Wabern, Switzerland), Ridler, N.M. (NPL, National Physical Laboratory, Teddington, United Kingdom), Salter, M.J. (NPL, National Physical Laboratory, Teddington, United Kingdom) and Kuhlmann, K. (PTB, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany)
Keywords:

Verification, scattering parameter, vector network analyzer.

Document typeProceeding
Journal title / Source2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Peer-reviewed articleYes
VolumeNA
IssueNA
Page numbers / Article numberNA
Publisher's nameIEEE
Publisher's address (city only)NA
Publication date 2016-07-15
ISSN2160-0171
DOI10.1109/CPEM.2016.7540508
Web URLhttp://ieeexplore.ieee.org/document/7540508/
LanguageEnglish

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