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Investigating Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz

Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Clarke, R. G. (University of Leeds, Leeds, United Kingdom)
Keywords:

Measurement repeatability, Measurement standards, VNA calibration, Submillimeter-wave measurements, Measurement uncertainty

Document typeProceeding
Journal title / Source82nd ARFTG Microwave Measurement Conference
Peer-reviewed articleYes
VolumeN/A
IssueN/A
Page numbers / Article numberN/A
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2013-11-18
Conference name82nd ARFTG Microwave Measurement Conference
Conference date18-11-2013 to 21-11-2013
Conference placeColumbus, Ohio, USA
ISSNN/A
DOI10.1109/ARFTG-2.2013.6737350
ISBNN/A
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6737350
LanguageEnglish

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