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A Nonlinear Verification Device for Nonlinear Vector Network Analyzers

Humphreys, D. A. (National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, U.K.), Rajabi, M. (Department of Electrical Engineering, KU Leuven, B-3001 Leuven, Belgium), Schreur, D. (Department of Electrical Engineering, KU Leuven, B-3001 Leuven, Belgium) and Nielsen, T. (Keysight Technologies, Alfred Nobels Vej 21D, 9220 Aalborg East, Denmark)
Keywords:

Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.

Document typeProceeding
Journal title / SourceProceedings Conference on Precision Electromagnetic Measurements 2016
Peer-reviewed articleYes
Volume1
Issue1
Page numbers / Article number1-2
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2016-07-10
Conference nameConference on Precision Electromagnetic Measurements
Conference date10-07-2016 to 16-07-2016
Conference placeWestin Hotel, Ottawa, Ontario, Canada
ISSN05891485
DOI10.1109/CPEM.2016.7540467
ISBNN/A
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7540467&isnumber=7539723
LanguageEnglish

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