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Connection repeatability of cross-connected waveguide verification standards for millimeter-wave vector network analysis

Huang, H. (National Institute of Metrology, Bejing, China), Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Salter, M. J. (National Physical Laboratory, Teddington, United Kingdom)

Measurement repeatability, cross-connected waveguide, verification standards, attenuation standards, VNAs, millimeter-wave measurements.

Document typeProceeding
Journal title / SourceAsia-Pacific Microwave Conference 2014 (APMC 2014)
Peer-reviewed articleYes
Page numbers / Article numberTH3G-09
Publisher's nameThe Institute of Electronics, Information and Communication Engineers (IEICE)
Publisher's address (city only)Tokyo, Japan
Publication date 2014-11-4
Conference nameAsia-Pacific Microwave Conference 2014 (APMC 2014)
Conference date04-11-2014 to 07-11-2014
Conference placeSendai, Japan
Web URLhttp://ieeexplore.ieee.org/document/7067875/
Persistent Identifierhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7067875

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