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Developing Traceability for S-parameter Measurements at Millimeter and Submillimeter Wavelengths

Ridler, N. (National Physical Laboratory, Teddington, United Kingdom), Clarke, R. (University of Leeds, Leeds, United Kingdom), Salter, M. (National Physical Laboratory, Teddington, United Kingdom) and Wilson, A. (National Physical Laboratory, Teddington, United Kingdom)

millimeter-wave measurements, submillimeter-wave measurements, measurement traceability, S-parameter measurements

Document typeArticle
Journal title / SourceIEEE Microwave Magazine
Peer-reviewed articleYes
Page numbers / Article number67 - 74
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2013-11-1
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6668984

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