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Evaluating the Effect of Using Precision Alignment Dowels on Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz

Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Clarke, R. G. (University of Leeds, Leeds, United Kingdom)
Keywords:

Measurement repeatability, Submillimeter-wave measurements, VNA measurements, Waveguide flanges, Waveguide interfaces, Waveguide measurements

Document typeProceeding
Journal title / Source84th ARFTG Microwave Measurement Conference (ARFTG)
Peer-reviewed articleYes
VolumeN/A
IssueN/A
Page numbers / Article numberN/A
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2014-12-4
Conference name84th ARFTG Microwave Measurement Conference (ARFTG)
Conference date04-12-2014 to 05-12-2014
Conference placeBoulder, Colorado, USA
ISSNN/A
DOI10.1109/ARFTG.2014.7013405
ISBNN/A
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7013405
LanguageEnglish

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