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Further Investigations into Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz

Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Clarke, R. G. (University of Leeds, Leeds, United Kingdom)

Measurement repeatability, Measurement standards, VNA calibration, Submillimeter-wave measurements, Measurement uncertainty

Document typeProceeding
Journal title / Source83rd ARFTG Microwave Measurement Conference (ARFTG)
Peer-reviewed articleYes
Page numbers / Article numberN/A
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2014-06-6
Conference name83rd ARFTG Microwave Measurement Conference (ARFTG)
Conference date06-06-2014 to 06-06-2014
Conference placeTampa, Florida, USA
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6899521

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