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Investigation of Verification Artifacts in WR-03 Waveguides

Shoaib, N. (INRIM, Torino, Italy), Kuhlmann, K. (PTB, Braunschweig, Germany), Judaschke, R. (PTB, Braunschweig, Germany), Sellone, M. (INRIM, Torino, Italy) and Brunetti, L. (INRIM, Torino, Italy)
Keywords:

Scattering parameters, Waveguide standards, Measurement uncertainty, Verification artifacts, Microwave measurements

Document typeArticle
Journal title / SourceJournal of Infrared, Millimeter, and Terahertz Waves
Peer-reviewed articleYes
Volume36
Issue11
Page numbers / Article number1089-1100
Publisher's nameSpringer
Publisher's address (city only)New York
Publication date 2015-08-15
ISSN1866-6906
DOI10.1007/s10762-015-0193-1
LanguageEnglish

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