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Impact of measurement uncertainty on modelling

Schreurs, D. (KU Leuven, Belgium), Liu, S. (KU Leuven, Belgium), Avolio, G. (KU Leuven, Belgium) and Ocket, I. (KU Leuven, Belgium)
Keywords:

Calibration, Measurement uncertainty, Microwave measurement, nonlinear modelling

Document typeProceeding
Journal title / SourceProc. of 21st International Conference on Microwave, Radar and Wireless Communications (MIKON)
Peer-reviewed articleYes
Volumen/a
Issuen/a
Page numbers / Article number1-4
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2016-05-9
Conference name21st International Conference on Microwave, Radar and Wireless Communications (MIKON)
Conference date9-11 May 2016
Conference placeKrakow, Poland
ISSNn/a
DOI10.1109/MIKON.2016.7492056
ISBNn/a
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7492056&isnumber=7491934
LanguageEnglish

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