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Residual Error Analysis of a Calibrated Vector Network Analyzer

Mubarak, F.A. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands) and Rietveld, G. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands)
Keywords:

S-parameter, VNA, VNA calibration, VNA verification, airline, ripple technique, residual error, assessment technique.

Document typeProceeding
Journal title / SourceMicrowave Measurement Conference (ARFTG)
Peer-reviewed articleYes
Volumen/a
Issue84th ARFTG proceedings
Page numbers / Article number1-6
Publisher's nameIEEE
Publisher's address (city only)n/a
Publication date 2014-12-4
ISSNn/a
DOI10.1109/ARFTG.2014.7013417
LanguageEnglish

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