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Calibration/Verification Standards for Measurement of Extremely High Impedances

Haase, Martin (CTU, Prague, Czech Republic) and Hoffmann, Karel (CTU, Prague, Czech Republic)
Keywords:

CST, High impedances, HFSS, Higher order modes, Measurement standards, Microwave connectors, Resistors, Scanning microwave microscopy, Thin film devices

Document typeProceeding
Journal title / SourceProc. of the 86th Microwave Measurement Conference (ARFTG)
Peer-reviewed articleYes
Volume86
Issuen/a
Page numbers / Article number1-4
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2015-12-3
Conference name86th Microwave Measurement Conference (ARFTG)
Conference date3-4 December 2015
Conference placeAtlanta, Georgia, USA
ISSNn/a
DOI10.1109/ARFTG.2015.7381474
ISBN978-1-4673-9246-4
Web URLhttp://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474
LanguageEnglish
Persistent Identifierhttp://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474

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