Image showing a crystal processor
15SIP02 | ISOChemDepth

An International Standard for Reliable Chemical Depth Profi...

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Image showing mathematical equations on blackboard
15SIP05 | TBCUnc

Advanced uncertainty evaluation: example and software for i...

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Image showing computer program code on a computer screen
15SIP06 | ValTraC

Validation of software development and analysis tools using...

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Image showing an Engineer examining machine part on a production line during performance testing
17SIP05 | CASoft

Software to maximize end user uptake of conformity assessme...

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Image showing Console In Master Control Room
17SIP07 | Adlab-XMet

Advancing laboratory based X-ray metrology techniques ...

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Image showing a crystal processor
NEW01 | TReND

Traceable characterisation of nanostructured devices ...

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NEW02 | Raman

Metrology for Raman Spectroscopy ...

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NEW03 | Nano ChOp

Chemical and optical characterisation of nanomaterials in b...

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Image showing mathematical equations on blackboard
NEW04 | Uncertainty

Novel mathematical and statistical approaches to uncertaint...

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NEW05 | MechProNO

Traceable measurement of mechanical properties of nano-obje...

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NEW06 | TraCIM

Traceability for computationally-intensive metrology ...

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NEW07 | THz Security

Microwave and terahertz metrology for homeland security ...

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NEW08 | MetNEMS

Metrology with/for NEMS ...

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NEW09 | METCO

Metrology of electrothermal coupling for new functional mat...

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Test

Project Number Short Name Title Coordinator
15SIP02 ISOChemDepth An International Standard for Reliable Chemical Depth Profiling of Organic Materials Charles Clifford (NPL)
15SIP05 TBCUnc Advanced uncertainty evaluation: example and software for industrial uptake Louise Wright (NPL)
15SIP06 ValTraC Validation of software development and analysis tools using TraCIM Ian Smith (NPL)
17SIP05 CASoft Software to maximize end user uptake of conformity assessment with measurement uncertainty
17SIP07 Adlab-XMet Advancing laboratory based X-ray metrology techniques Philipp Hönicke (PTB)
NEW01 TReND Traceable characterisation of nanostructured devices Alice Harling (NPL)
NEW02 Raman Metrology for Raman Spectroscopy Alice Harling (NPL)
NEW03 Nano ChOp Chemical and optical characterisation of nanomaterials in biological systems Heidi Goenaga-Infante (LGC)
NEW04 Uncertainty Novel mathematical and statistical approaches to uncertainty evaluation Markus Bär (PTB)
NEW05 MechProNO Traceable measurement of mechanical properties of nano-objects Uwe Brand (PTB)
NEW06 TraCIM Traceability for computationally-intensive metrology Alistair Forbes (NPL)
NEW07 THz Security Microwave and terahertz metrology for homeland security Thomas Kleine-Ostmann (PTB)
NEW08 MetNEMS Metrology with/for NEMS Ling Hao (NPL)
NEW09 METCO Metrology of electrothermal coupling for new functional materials technology
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