Test
| Project Number | Short Name | Title | Coordinator |
|---|---|---|---|
| 20IND07 | TracOptic | Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors | Uwe Brand (PTB) |
| 20IND08 | MetExSPM | Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy | Virpi Korpelainen (MIKES) |
| 20IND09 | PowerElec | Metrology in manufacturing compound semiconductors for power electronics | Sebastian Wood (NPL) |
| 20IND10 | Decarb | Metrology for decarbonising the gas grid | Lucy Culleton (NPL) |
| 20IND11 | MetHyInfra | Metrology infrastructure for high-pressure gas and liquified hydrogen flows | Hans-Benjamin Böckler (PTB) |
| 20IND12 | Elena | Electrical nanoscale metrology in industry | François Piquemal (LNE) |
| 20IND13 | SAFEST | Sustainable advanced flow meter calibration for the transport sector | Corinna Kroner (PTB) |
| 20SIP05 | KTOC | Knowledge Transfer for Optical Communications | Irshaad Fatadin (NPL) |
| IND01 | HiTeMS | High temperature metrology for industrial applications (>1000 °C) | Graham Machin (NPL) |
| IND02 | EMINDA | Electromagnetic characterisation of materials for industrial applications up to microwave frequencies | Bob Clarke (NPL) |
| IND03 | HighPRES | High pressure metrology for industrial applications | Wladimir Sabuga (PTB) |
| IND04 | MetroMetal | Ionising radiation metrology for the metallurgical industry | |
| IND05 | MeProVisc | Dynamic Mechanical Properties and Long-term Deformation Behaviour of Viscous Materials | |
| IND06 | MIQC | Metrology for industrial quantum communication technologies | Maria Luisa Rastello (INRIM) |
| IND07 | Thin Films | Metrology for the manufacturing of thin films | Fernando Araujo de Castro (NPL) |
| IND08 | MetMags | Metrology for Advanced Industrial Magnetics | Hans Werner Schumacher (PTB) |
| IND09 | Dynamic | Traceable Dynamic Measurement of Mechanical Quantities | Thomas Bruns (PTB) |
| IND10 | Form | Optical and tactile metrology for absolute form characterisation | |
| IND11 | MADES | Metrology to Assess the Durability and Function of Engineered Surfaces | Mark Gee (NPL) |
| IND12 | Vacuum | Vacuum metrology for production environments | Karl Jousten (PTB) |
78 result(s)