IND52 | xDReflect

Multidimensional reflectometry for industry ...

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17IND14 | WRITE

Precision Time for Industry ...

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14SIP01 | Vacuum ISO

Technical Specifications for quadrupole mass spectrometers ...

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IND12 | Vacuum

Vacuum metrology for production environments ...

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IND16 | Ultrafast

Metrology for ultrafast electronics and high-speed communic...

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19SIP05 | TTPWC

Technology Transfer of Photonic Waveguide Characterisation ...

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20IND07 | TracOptic

Traceable industrial 3D roughness and dimensional measureme...

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IND62 | TIM

Traceable in-process dimensional measurement ...

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IND07 | Thin Films

Metrology for the manufacturing of thin films ...

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14SIP05 | TF-STANDARD

Developing a Standard for Valid Methodology for the Charact...

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14SIP04 | TF-Plastic

Standardisation and Dissemination for Measurements of High ...

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IND13 | T3D

Thermal design and time-dependent dimensional drift behavio...

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IND15 | SurfChem

Traceable quantitative surface chemical analysis for indust...

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14IND03 | Strength-ABLE

Metrology for length-scale engineering of materials ...

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17IND02 | SmartCom

Communication and validation of smart data in IoT-networks ...

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IND17 | Scatterometry

Metrology of small structures for the manufacturing of elec...

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20IND13 | SAFEST

Sustainable advanced flow meter calibration for the transpo...

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20IND05 | QADeT

Quantum sensors for metrology based on single-atom-like dev...

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IND56 | Q-AIMDS

Chemical metrology tools to support the manufacture of adva...

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20IND06 | PROMETH2O

Metrology for trace water in ultra-pure process gases ...

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Test

Project Number Short Name Title Coordinator
IND52 xDReflect Multidimensional reflectometry for industry Gael Obein (LNE-LCM/CNAM)
17IND14 WRITE Precision Time for Industry Davide Calonico (INRIM)
14SIP01 Vacuum ISO Technical Specifications for quadrupole mass spectrometers and outgassing rates for assessing the quality of vacuum environments Karl Jousten (PTB)
IND12 Vacuum Vacuum metrology for production environments Karl Jousten (PTB)
IND16 Ultrafast Metrology for ultrafast electronics and high-speed communications Mark Bieler (PTB)
19SIP05 TTPWC Technology Transfer of Photonic Waveguide Characterisation Irshaad Fatadin (NPL)
20IND07 TracOptic Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors Uwe Brand (PTB)
IND62 TIM Traceable in-process dimensional measurement
IND07 Thin Films Metrology for the manufacturing of thin films Fernando Araujo de Castro (NPL)
14SIP05 TF-STANDARD Developing a Standard for Valid Methodology for the Characterisation of Functional Alloy Thin Films Cornelia Streeck (PTB)
14SIP04 TF-Plastic Standardisation and Dissemination for Measurements of High Performance Barrier Layers Paul Brewer (NPL)
IND13 T3D Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures Jens Flügge (PTB)
IND15 SurfChem Traceable quantitative surface chemical analysis for industrial applications
14IND03 Strength-ABLE Metrology for length-scale engineering of materials Mark Gee (NPL)
17IND02 SmartCom Communication and validation of smart data in IoT-networks Wiebke Heeren (PTB)
IND17 Scatterometry Metrology of small structures for the manufacturing of electronic and optical devices Bernd Bodermann (PTB)
20IND13 SAFEST Sustainable advanced flow meter calibration for the transport sector Corinna Kroner (PTB)
20IND05 QADeT Quantum sensors for metrology based on single-atom-like device technology Paolo Traina (INRIM)
IND56 Q-AIMDS Chemical metrology tools to support the manufacture of advanced biomaterials in the medical device industry Fiona Moriarty (NPL)
20IND06 PROMETH2O Metrology for trace water in ultra-pure process gases Vito C. Fernicola (INRIM)
78 result(s)
Element 1 Element 2 Element 3 Element 1 Element 1 Element 1 Element 1 Element 1 Logo-Footer