Image showing a closeup of a high pressure hydrogen fuel nozzle
20IND11 | MetHyInfra

Metrology infrastructure for high-pressure gas and liquifie...

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Image of a Silicon wafer production line
20IND09 | PowerElec

Metrology in manufacturing compound semiconductors for powe...

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Image showing an extreme close up of a diamond's structure
20IND05 | QADeT

Quantum sensors for metrology based on single-atom-like dev...

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Smart city with communication network
20IND03 | FutureCom

RF Measurements for future communications applications ...

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Image of used electronic phones for recycling
20IND01 | MetroCycleEU

Metrology for the recycling of Technology Critical Elements...

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Image showing an engineer using a laptop to  control a robotic arm  performing maintenance
17IND02 | SmartCom

Communication and validation of smart data in IoT-networks ...

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Image showing fibre optic cable
19SIP05 | TTPWC

Technology Transfer of Photonic Waveguide Characterisation ...

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Image showing server racks in a data centre
20SIP05 | KTOC

Knowledge Transfer for Optical Communications ...

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Image showing pressure meters on natural gas pipeline
17IND07 | DynPT

Development of measurement and calibration techniques for d...

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Image showing a futuristic system core or reactor
17IND11 | Hi-TRACE

Industrial process optimisation through improved metrology ...

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Image showing row of water meters of cold and hot water
17IND13 | Metrowamet

Metrology for real-world domestic water metering ...

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Image showing a car engine on white background
20IND13 | SAFEST

Sustainable advanced flow meter calibration for the transpo...

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Image showing robots assembling products in automatic factory
17IND12 | Met4FoF

Metrology for the Factory of the Future ...

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Image showing engineer in sterile coverall holding microchip with gloves and examining it
17IND09 | MetAMCII

Metrology for Airborne Molecular Contaminants II ...

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Image of a Printed circuit board
14IND09 | MetHPM

Metrology for highly-parallel manufacturing ...

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IND63 | MetAMC

Metrology for airborne molecular contamination in manufactu...

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Image showing a Computer processor on human finger
20IND08 | MetExSPM

Traceability of localised functional properties of nanostru...

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IND54 | Nanostrain

Novel electronic devices based on control of strain at the ...

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Image showing nanoparticles
14IND12 | Innanopart

Metrology for innovative nanoparticles ...

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Image showing a close up of a circuit board
14IND02 | PlanarCal

Microwave measurements for planar circuits and components ...

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Test

Project Number Short Name Title Coordinator
20IND11 MetHyInfra Metrology infrastructure for high-pressure gas and liquified hydrogen flows Hans-Benjamin Böckler (PTB)
20IND09 PowerElec Metrology in manufacturing compound semiconductors for power electronics Sebastian Wood (NPL)
20IND05 QADeT Quantum sensors for metrology based on single-atom-like device technology Paolo Traina (INRIM)
20IND03 FutureCom RF Measurements for future communications applications Dilbagh Singh (NPL)
20IND01 MetroCycleEU Metrology for the recycling of Technology Critical Elements to support Europe's circular economy agenda Johanna Noireaux (LNE)
17IND02 SmartCom Communication and validation of smart data in IoT-networks Wiebke Heeren (PTB)
19SIP05 TTPWC Technology Transfer of Photonic Waveguide Characterisation Irshaad Fatadin (NPL)
20SIP05 KTOC Knowledge Transfer for Optical Communications Irshaad Fatadin (NPL)
17IND07 DynPT Development of measurement and calibration techniques for dynamic pressures and temperatures Richard Högström (MIKES)
17IND11 Hi-TRACE Industrial process optimisation through improved metrology of thermophysical properties Bruno Hay (LNE)
17IND13 Metrowamet Metrology for real-world domestic water metering Corinna Kroner (PTB)
20IND13 SAFEST Sustainable advanced flow meter calibration for the transport sector Corinna Kroner (PTB)
17IND12 Met4FoF Metrology for the Factory of the Future Sascha Eichstädt (PTB)
17IND09 MetAMCII Metrology for Airborne Molecular Contaminants II Geoffrey Barwood (NPL)
14IND09 MetHPM Metrology for highly-parallel manufacturing Christopher Jones (NPL)
IND63 MetAMC Metrology for airborne molecular contamination in manufacturing environments Kaj Nyholm (MIKES)
20IND08 MetExSPM Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy Virpi Korpelainen (MIKES)
IND54 Nanostrain Novel electronic devices based on control of strain at the nanoscale Louise Brown (NPL)
14IND12 Innanopart Metrology for innovative nanoparticles Alex Shard (NPL)
14IND02 PlanarCal Microwave measurements for planar circuits and components Uwe Arz (PTB)
78 result(s)
Element 1 Element 2 Element 3 Element 1 Element 1 Element 1 Element 1 Element 1 Logo-Footer