Test
Project Number | Short Name | Title | Coordinator |
---|---|---|---|
20IND11 | MetHyInfra | Metrology infrastructure for high-pressure gas and liquified hydrogen flows | Hans-Benjamin Böckler (PTB) |
20IND09 | PowerElec | Metrology in manufacturing compound semiconductors for power electronics | Sebastian Wood (NPL) |
20IND05 | QADeT | Quantum sensors for metrology based on single-atom-like device technology | Paolo Traina (INRIM) |
20IND03 | FutureCom | RF Measurements for future communications applications | Dilbagh Singh (NPL) |
20IND01 | MetroCycleEU | Metrology for the recycling of Technology Critical Elements to support Europe's circular economy agenda | Johanna Noireaux (LNE) |
17IND02 | SmartCom | Communication and validation of smart data in IoT-networks | Wiebke Heeren (PTB) |
19SIP05 | TTPWC | Technology Transfer of Photonic Waveguide Characterisation | Irshaad Fatadin (NPL) |
20SIP05 | KTOC | Knowledge Transfer for Optical Communications | Irshaad Fatadin (NPL) |
17IND07 | DynPT | Development of measurement and calibration techniques for dynamic pressures and temperatures | Richard Högström (MIKES) |
17IND11 | Hi-TRACE | Industrial process optimisation through improved metrology of thermophysical properties | Bruno Hay (LNE) |
17IND13 | Metrowamet | Metrology for real-world domestic water metering | Corinna Kroner (PTB) |
20IND13 | SAFEST | Sustainable advanced flow meter calibration for the transport sector | Corinna Kroner (PTB) |
17IND12 | Met4FoF | Metrology for the Factory of the Future | Sascha Eichstädt (PTB) |
17IND09 | MetAMCII | Metrology for Airborne Molecular Contaminants II | Geoffrey Barwood (NPL) |
14IND09 | MetHPM | Metrology for highly-parallel manufacturing | Christopher Jones (NPL) |
IND63 | MetAMC | Metrology for airborne molecular contamination in manufacturing environments | Kaj Nyholm (MIKES) |
20IND08 | MetExSPM | Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy | Virpi Korpelainen (MIKES) |
IND54 | Nanostrain | Novel electronic devices based on control of strain at the nanoscale | Louise Brown (NPL) |
14IND12 | Innanopart | Metrology for innovative nanoparticles | Alex Shard (NPL) |
14IND02 | PlanarCal | Microwave measurements for planar circuits and components | Uwe Arz (PTB) |
78 result(s)