IND63 | MetAMC

Metrology for airborne molecular contamination in manufactu...

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IND62 | TIM

Traceable in-process dimensional measurement ...

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IND61 | Metrosion

Metrology to enable high temperature erosion testing ...

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IND60 | EMC

Improved EMC test methods in industrial environments ...

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IND59 | Microparts

Multi-sensor metrology for microparts in innovative industr...

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IND58 | 6DoF

Metrology for movement and positioning in six degrees of fr...

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IND57 | MetroNORM

Metrology for processing materials with high natural radioa...

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IND56 | Q-AIMDS

Chemical metrology tools to support the manufacture of adva...

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IND55 | Mclocks

Compact and high-performing microwave clocks for industrial...

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IND54 | Nanostrain

Novel electronic devices based on control of strain at the ...

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IND53 | LUMINAR

Large volume metrology in industry ...

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IND52 | xDReflect

Multidimensional reflectometry for industry ...

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IND51 | MORSE

Metrology for optical and RF communication systems ...

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IND17 | Scatterometry

Metrology of small structures for the manufacturing of elec...

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IND16 | Ultrafast

Metrology for ultrafast electronics and high-speed communic...

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IND15 | SurfChem

Traceable quantitative surface chemical analysis for indust...

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IND14 | Frequency

New generation of frequency standards for industry ...

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IND13 | T3D

Thermal design and time-dependent dimensional drift behavio...

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Image showing a High technology scientific vacuum chamber
IND12 | Vacuum

Vacuum metrology for production environments ...

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IND11 | MADES

Metrology to Assess the Durability and Function of Engineer...

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Test

Project Number Short Name Title Coordinator
IND63 MetAMC Metrology for airborne molecular contamination in manufacturing environments Kaj Nyholm (MIKES)
IND62 TIM Traceable in-process dimensional measurement
IND61 Metrosion Metrology to enable high temperature erosion testing Tony Fry (NPL)
IND60 EMC Improved EMC test methods in industrial environments Mustafa Cetintas (UME)
IND59 Microparts Multi-sensor metrology for microparts in innovative industrial products Ulrich Neuschaefer-Rube (PTB)
IND58 6DoF Metrology for movement and positioning in six degrees of freedom Jens Flügge (PTB)
IND57 MetroNORM Metrology for processing materials with high natural radioactivity
IND56 Q-AIMDS Chemical metrology tools to support the manufacture of advanced biomaterials in the medical device industry Fiona Moriarty (NPL)
IND55 Mclocks Compact and high-performing microwave clocks for industrial applications Salvatore Micalizio (INRIM)
IND54 Nanostrain Novel electronic devices based on control of strain at the nanoscale Louise Brown (NPL)
IND53 LUMINAR Large volume metrology in industry Andrew Lewis (NPL)
IND52 xDReflect Multidimensional reflectometry for industry Gael Obein (LNE-LCM/CNAM)
IND51 MORSE Metrology for optical and RF communication systems
IND17 Scatterometry Metrology of small structures for the manufacturing of electronic and optical devices Bernd Bodermann (PTB)
IND16 Ultrafast Metrology for ultrafast electronics and high-speed communications Mark Bieler (PTB)
IND15 SurfChem Traceable quantitative surface chemical analysis for industrial applications
IND14 Frequency New generation of frequency standards for industry Patrick Gill (NPL)
IND13 T3D Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures Jens Flügge (PTB)
IND12 Vacuum Vacuum metrology for production environments Karl Jousten (PTB)
IND11 MADES Metrology to Assess the Durability and Function of Engineered Surfaces Mark Gee (NPL)
78 result(s)
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