Metrology for industrial quantum communications: the MIQC project

Rastello M L, Degiovanni I P, Sinclair A G, Kück S, Chunnilall C J, Porrovecchio G, Smid M, Manoocheri F, Ikonen E, Kubarsepp T, Stucki D, Hong K S, Kim S K, Tosi A, Brida G, Meda A, Piacentini F, Traina P, Al Natsheh A, Cheung J Y, Müller I, Klein R, Vaigu A
Keywords:

Metrology, quantum cryptography, quantum communication

Document type Article
Journal title / Source Metrologia
Volume 51
Issue 6
Page numbers / Article number 10
Publication date 2014-11-20
ISSN 0026-1394
DOI 10.1088/0026-1394/51/6/S267
Web URL http://iopscience.iop.org/0026-1394/

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