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References

	Houtzager, E., Rietveldt, G., Hällström, J., Elg, A. and van der Beek, J. Selection and characterization of resistors for a HVDC reference divider (Proceedings) CPEM 2012 Washington DC, USA, 01 - 06 July 2012 Publisher: IEEE, 2012 EMRP A169: Call 2009 Energy ENG07: HVDC: Metrology for High Voltage Direct Current
	Pollinger, F., Hieta, T., Vainio, M., Doloca, N., Abou-Zeid, A., Meiners-Hagen, K. and Merimaa, M. Effective humidity in length measurements: comparison of three approaches Measurement Science and Technology, 23(2), 2012, 025502-025503 (Article) stacks.iop.org/MST/23/025503 iMERA-Plus: Call 2007 Length T3.J3.1: Long distance: Absolute long distance measurement in air
	Volkers, H. and Bruns, T. The influence of source impedance on charge amplifier (Proceedings) XX IMEKO World Congress : Metrology for Green Growth Busan, Republic of Korea, 9 - 14 September 2012 2012 www.imeko.org/publication...IMEKO-WC-2012-TC22-O6.pdf EMRP A169: Call 2010 Industry IND09: Dynamic: Traceable Dynamic Measurement of Mechanical Quantities
	Bos, E., Moers, A. and van Riel, M. Trinano N100 3D Measurements with Nanometer Repeatability and Effects of Probe-Surface Interaction Volume 54 (Proceedings) 27th Annual Meeting of the American Society for Precision Engineering San Diego, CA USA, 21 - 26 October 2012 2012 EMRP A169: Call 2010 Industry IND10: Form metrology: Optical and tactile metrology for absolute form characterization
	Pramann, A., Rienitz, O., Schiel, D., Guettler, B. and Valkiers, S. Novel concept for the mass spectrometric determination of absolute isotopic abundances with improved measurement uncertainty: Part 3—Molar mass of silicon highly enriched in 28Si International Journal of Mass Spectrometry, 305(1), August 2011 (Article) iMERA-Plus: Call 2007 SI and Fundamental Metrology T1.J1.2: NAH: Avogadro and molar Planck constants for the redefinition of the kilogram
	Andreas, B., Azuma, Y., Bartl, G., Becker, P., Bettin, H., Borys, M., Busch, I., Fuchs, P., Fujii, K., Fujimoto, H., Kessler, E., Krumrey, M., Kuetgens, U., Mizushima, N., Nicolaus, A., Picard, A., Pramann, A., Rienitz, O., Schiel, D., Valkiers, S., Waseda, A. and Zakel, S. Counting the atoms in a 28Si crystal for a new kilogram definition Metrologia, 48(2), March 2011 (Article) iMERA-Plus: Call 2007 SI and Fundamental Metrology T1.J1.1: e-Mass: The watt balance route towards a new definition of the kilogram
	Pramann, A., Rienitz, O., Schiel, D., Schlote, J., Guettler, B. and Valkiers, S. Molar mass of silicon highly enriched in 28Si determined by IDMS Metrologia, 48(2), March 2011 (Article) iMERA-Plus: Call 2007 SI and Fundamental Metrology T1.J1.2: NAH: Avogadro and molar Planck constants for the redefinition of the kilogram
	Valkiers, S., Mana, G., Fujii, K. and Becker, P. Si primary standards for the calibration of ion-current ratios in the molar-mass measurement of natural Si single crystals Metrologia, 48(2), March 2011 (Article) iMERA-Plus: Call 2007 SI and Fundamental Metrology T1.J1.2: NAH: Avogadro and molar Planck constants for the redefinition of the kilogram
	Bulska, E., Drozdov, M., Mana, G., Pramann, A., Rienitz, O., Sennikov, P. and Valkiers, S. The isotopic composition of enriched Si: a data analysis Metrologia, 48(2), March 2011 (Article) iMERA-Plus: Call 2007 SI and Fundamental Metrology T1.J1.2: NAH: Avogadro and molar Planck constants for the redefinition of the kilogram
	Hughes, B., Forbes, A., Lewis, A., Sun, W., Veal, D. and Nasr, K. Laser tracker error determination using a network measurement Measurement Science and Technology, 22(045103), March 2011, 12pp. (Article) iMERA-Plus: Call 2007 Length T3.J2.2: NIMTech: Metrology for New Industrial Measurement Technologies

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