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References

	Bessonova, O. and Wilkens, V. Membrane hydrophone measurement and numerical simulation of HIFU fields up to developed shock regimes IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 60(2), February 2013, 209-300 (Article) EMRP A169: Call 2011 Metrology for Health HLT03: DUTy: Dosimetry for ultrasound therapy
	Wulf, M. Error accounting algorithm for electron counting experiments Physical Review B, 87, January 2013, 035312 (Article) http://prb.aps.org/abstract/PRB/v87/i3/e035312 EMRP A169: Call 2011 SI Broader Scope SIB07: Qu-Ampere: Quantum ampere: Realisation of the new SI ampere
	Sasso, C., Massa, E. and Mana, G. The watt-balance operation: magnetic force and induced electric potential on a conductor in a magnetic Metrologia, 50(2), 2013 (Article) stacks.iop.org/Met/50/164 EMRP A169: Call 2011 SI Broader Scope SIB03: kNOW Realisation of the awaited definition of the kilogram - resolving the discrepancies
	Nwaboh, J., Werhahn, O., Ortwein, P., Schiel, D. and Ebert, V. Laser-spectrometric gas analysis: CO2–TDLAS at 2 μm Measurement Science and Technology, 24, 2013, 015202 (12pp) (Article) iMERA-Plus: Call 2007 Health T2.J02: Breath analysis: Breath analysis as a diagnostic tool for early disease detection
	Iacomussi, P., Rossi, G. and Rossi, L. A comparison between different light sources induced glare on perceived contrast (Proceedings) 27th Session of the CIE Sun City, South Africa, 9 - 16 July 2011 2013 EMRP A169: Call 2009 Energy ENG05: Lighting: Metrology for Solid State Lighting
	Ehret, G., Schulz, M., Baier, M. and Fitzenreiter, A. Optical measurement of absolute flatness with the deflectometric measurement systems at PTB (Proceedings) 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012) Lyon, France, 09 - 13 July 2012 Publisher: IOP, 2013 http://iopscience.iop.org...42-6596_425_15_152016.pdf EMRP A169: Call 2010 Industry IND10: Form metrology: Optical and tactile metrology for absolute form characterization
	Hoffmann, J., Wollensack, M., Zeier, M., Niegemann, J., Huber, H. and Kienberger, F. Calibration Algorithm for Nearfield Scanning Microwave Microscopes (Proceedings) IEEE Nano 2012: 12th International Conference on Nanotechnology Birmingham, UK, 20 - 23 August 2012 2013 EMRP A169: Call 2010 Industry IND02: EMINDA: Electromagnetic Characterization of Materials for Industrial Applications up to Microwave Frequencies
	Brida, G., Degiovanni, I., Genovese, M., Piacentini, F., Traina, P., Della Frera, A., Tosi, A., Bahgat Shehata, A., Scarcella, C., Gulinatti, A., Ghioni, M., Polyakov, S., Migdall, A. and Giudice, A. An extremely low-noise heralded single-photon source: A breakthrough for quantum technologies Applied Physics Letters, 101, November 2012, 221112-4 (Article) EMRP A169: Call 2010 Industry IND06: MIQC: Metrology for Industrial Quantum Communications
	Zhao, D., Braun, J., Overney, F., Lippert, T. and Christensen, A. D2.1.1 Comparison Report on Measurement of Electrical Quantities of Selected SSL Lamps Project title (JRP): ENG05: Lighting: Metrology for Solid State Lighting October 2012 EMRP A169: Call 2009 Energy ENG05: Lighting: Metrology for Solid State Lighting
	Rodriguez Higuero, M. and Rodrigo Gómez, I. Cálculo de Matrices de Covarianza en la Adquisición de Trazas de Osciloscopios Digitales (DSO y RTDO) (Proceedings) XXVII Simposium Nacional de la Unión Científica Internacional de Radio URSI 2012 Elche (Alicante), Spain, 12 - 14 September 2012 September 2012 ursi.usc.es/articulos_mod...12elche_submission_27.pdf EMRP A169: Call 2010 Industry IND16: Ultrafast: Metrology for ultrafast electronics and high-speed communications

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